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TY - CONF AU - Baboi, N. AU - Duhme, H.T. AU - Hensler, O. AU - Kube, G. AU - Lensch, T. AU - Lipka, D. AU - Lorbeer, B. AU - Neumann, Re. AU - Smirnov, P.A. AU - Wamsat, T. AU - Werner, M. ED - Schaa, Volker RW TI - Upgrade and Status of Standard Diagnostic-Systems at FLASH and FLASHForward J2 - Proc. of IBIC2018, Shanghai, China, 9-13 September 2018 C1 - Shanghai, China T2 - International Beam Instrumentation Conference T3 - 7 LA - english AB - Electron beam diagnostics plays a crucial role in the precise and reliable generation of ultra-short high bril-liance XUV and soft X-ray beams at the Free Electron Laser in Hamburg (FLASH). Most diagnostic systems monitor each of up to typically 600 bunches per beam, with a frequency of up to 1 MHz, a typical charge be-tween 0.1 and 1 nC and an energy of 350 to 1250 MeV. The diagnostic monitors have recently undergone a major upgrade. This process started several years ago with the development of monitors fulfilling the requirements of the European XFEL and of the FLASH2 undulator beamline and it continued with their installation and commissioning. Later they have been further improved and an upgrade was made in the old part of the linac. Also the FLASHForward plasma-wakefield acceleration experiment has been installed in the third beamline. This paper will give an overview of the upgrade of the BPM, Toroid and BLM systems, pointing out to their improved performance. Other systems underwent a partial upgrade, mainly by having their VME-based ADCs replaced with MTCA type. The overall status of the diagnostic will be reviewed. PB - JACoW Publishing CP - Geneva, Switzerland SP - 13 EP - 17 KW - FEL KW - electron KW - diagnostics KW - electronics KW - cavity DA - 2018/11 PY - 2018 SN - 978-3-95450-201-1 DO - 10.18429/JACoW-IBIC2018-MOOB03 UR - http://jacow.org/ibic2018/papers/moob03.pdf ER -