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RIS citation export for WEPA16: Micro-Bunching Instability Monitor for X-ray Free Electron Laser

AU - Kim, C.
AU - Kang, H.-S.
AU - Kim, G.
AU - Ko, I.S.
AU - Ko, J.H.
ED - Schaa, Volker RW
TI - Micro-Bunching Instability Monitor for X-ray Free Electron Laser
J2 - Proc. of IBIC2018, Shanghai, China, 9-13 September 2018
C1 - Shanghai, China
T2 - International Beam Instrumentation Conference
T3 - 7
LA - english
AB - A direct method was developed to measure the micro-bunching instability in the X-ray Free Electron Laser (XFEL). The micro-bunching instability comes from the interaction between the electron beam and the coherent synchrotron radiation (CSR), and the FEL intensity can be affected significantly by the micro-bunching instability. However, no effective method had been introduced to monitor the micro-bunching instability, so that we installed a CCD camera to measure the micro-bunching instability after the bunch compressor. The CCD camera showed the micro-bunching instability successfully, and more interesting features of the micro-bunching instability were revealed from it.
PB - JACoW Publishing
CP - Geneva, Switzerland
SP - 404
EP - 406
KW - radiation
KW - electron
KW - bunching
KW - laser
KW - linac
DA - 2018/11
PY - 2018
SN - 978-3-95450-201-1
DO - 10.18429/JACoW-IBIC2018-WEPA16
UR - http://jacow.org/ibic2018/papers/wepa16.pdf
ER -