Author: Huck, H.
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WEPB04 Comparison of YAG Screens and LYSO Screens at PITZ 438
  • R. Niemczyk, P. Boonpornprasert, Y. Chen, J.D. Good, M. Groß, H. Huck, I.I. Isaev, D.K. Kalantaryan, C. Koschitzki, M. Krasilnikov, X. Li, O. Lishilin, G. Loisch, D. Melkumyan, A. Oppelt, H.J. Qian, Y. Renier, F. Stephan, Q.T. Zhao
    DESY Zeuthen, Zeuthen, Germany
  • W. Hillert
    University of Hamburg, Institut für Experimentalphysik, Hamburg, Germany
  The Photo Injector Test facility at DESY in Zeuthen (PITZ) is dedicated to the development of high-brightness electron sources for free-electron lasers. At PITZ, to measure the emittance of space-charge-dominated beams, the slit scan technique is used. For slice emittance measurements a transverse deflecting structure (TDS) is employed. The electron beam distribution is measured by means of scintillator screens. Both the TDS and the slit mask reduce the signal strength, giving stringent requirements on the sensitivity of the screens. At PITZ, high-sensitivity Ce:LYSO screens have been installed at the same screen stations as the standard Ce:YAG screens to solve low-intensity issues. A comparison of both screens is presented.  
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