Author: Ko, J.H.
Paper Title Page
WEPA16 Micro-Bunching Instability Monitor for X-ray Free Electron Laser 404
 
  • C. Kim, H.-S. Kang, G. Kim, I.S. Ko
    PAL, Pohang, Kyungbuk, Republic of Korea
  • J.H. Ko
    POSTECH, Pohang, Kyungbuk, Republic of Korea
 
  A direct method was developed to measure the micro-bunching instability in the X-ray Free Electron Laser (XFEL). The micro-bunching instability comes from the interaction between the electron beam and the coherent synchrotron radiation (CSR), and the FEL intensity can be affected significantly by the micro-bunching instability. However, no effective method had been introduced to monitor the micro-bunching instability, so that we installed a CCD camera to measure the micro-bunching instability after the bunch compressor. The CCD camera showed the micro-bunching instability successfully, and more interesting features of the micro-bunching instability were revealed from it.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEPA16  
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