Author: Lensch, T.
Paper Title Page
MOOB03 Upgrade and Status of Standard Diagnostic-Systems at FLASH and FLASHForward 13
 
  • N. Baboi, H.T. Duhme, O. Hensler, G. Kube, T. Lensch, D. Lipka, B. Lorbeer, Re. Neumann, P.A. Smirnov, T. Wamsat, M. Werner
    DESY, Hamburg, Germany
 
  Electron beam diagnostics plays a crucial role in the precise and reliable generation of ultra-short high bril-liance XUV and soft X-ray beams at the Free Electron Laser in Hamburg (FLASH). Most diagnostic systems monitor each of up to typically 600 bunches per beam, with a frequency of up to 1 MHz, a typical charge be-tween 0.1 and 1 nC and an energy of 350 to 1250 MeV. The diagnostic monitors have recently undergone a major upgrade. This process started several years ago with the development of monitors fulfilling the requirements of the European XFEL and of the FLASH2 undulator beamline and it continued with their installation and commissioning. Later they have been further improved and an upgrade was made in the old part of the linac. Also the FLASHForward plasma-wakefield acceleration experiment has been installed in the third beamline. This paper will give an overview of the upgrade of the BPM, Toroid and BLM systems, pointing out to their improved performance. Other systems underwent a partial upgrade, mainly by having their VME-based ADCs replaced with MTCA type. The overall status of the diagnostic will be reviewed.  
slides icon Slides MOOB03 [2.728 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-MOOB03  
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WEOB03 The European XFEL Beam Loss Monitor System 357
 
  • T. Wamsat, T. Lensch
    DESY, Hamburg, Germany
 
  The European XFEL MTCA based Beam Loss Monitor System (BLM) is composed of about 470 monitors, which are part of the Machine Protection System (MPS). The BLMs detect losses of the electron beam, in order to protect accelerator components from damage and excessive activation, in particular the undulators, since they are made of permanent magnets. Also each cold accelerating module is equipped with a BLM to measure the sudden onset of field emission (dark current) in cavities. In addition some BLMs are used as detectors for wire- scanners. Experience from the already running BLM system in FLASH2 which is developed for XFEL and tested here, led to a fast implementation of the system in the XFEL. Further firmware and server developments related to alarm generation and handling are ongoing. The BLM systems structure, the current status and the different possibilities to trigger alarms which stop the electron beam will be presented.  
slides icon Slides WEOB03 [3.631 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEOB03  
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WEPC05 The European XFEL Wire Scanner System 498
 
  • T. Lensch, S. Liu, M. Scholz
    DESY, Hamburg, Germany
 
  The European-XFEL (E-XFEL) is an X-ray Free Electron Laser facility located in Hamburg (Germany). The superconducting accelerator for up to 17.5 GeV electrons will provide photons simultaneously to several user stations. Currently 12 Wire Scanner units are used to image transverse beam profiles in the high energy sections. These scanners provide a slow scan mode which is currently used to measure beam emittance and beam halo distributions. When operating with long bunch trains (>100 bunches) also fast scans are planned to measure beam sizes in an almost nondestructive manner. Scattered electrons can be detected with regular Beam Loss Monitors (BLM) as well as dedicated wire scanner detectors. Latter are installed in different variants at certain positions in the machine. Further developments are ongoing to optimize the sensitivity of the detectors to be able to measure both, beam halo and beam cores within the same measurement with the same detector. This paper describes the current status of the system and examples of different slow scan measurements.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEPC05  
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