Author: Liu, X.Q.
Paper Title Page
WEPA13 Electro-Optic Modulator Based Beam Arrival Time Monitor for SXFEL* 396
  • X.Q. Liu, L.F. Hua, L.W. Lai, Y.B. Leng, R.X. Yuan
    SINAP, Shanghai, People's Republic of China
  • N. Zhang
    SSRF, Shanghai, People's Republic of China
  Beam arrival time monitor (BAM) is an important tool to investigate the temporal characteristic of elec-tron bunch in free electron laser (FEL) like Shanghai soft X-ray Free Electron Laser (SXFEL). Since the timing jitter of electron bunch will affect the FEL's stability and the resolution of time-resolved experi-ment at FELs, it is necessary to precisely measure the electron bunch arrival time so as to reduce the timing jitter of the electron bunch with beam based feedback. The beam arrival time monitor based on electro-optic modulator (EOM) is already planned and will be de-veloped and tested at SXFEL in the next three years. Here the design and preliminary results of the EOM based beam arrival time monitor will be introduced in this paper.  
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