Author: Nakamura, A.
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WEPC08 Optical System of Beam Induced Fluorescence Monitor Toward MW Beam Power at the J-PARC Neutrino Beamline 505
  • S.V. Cao, M.L. Friend, K. Sakashita
    KEK, Ibaraki, Japan
  • M. Hartz
    Kavli IPMU, Kashiwa, Japan
  • A. Nakamura
    Okayama University, Okayama, Japan
  A Beam Induced Fluorescence (BIF) monitor is being developed as an essential part of the monitor update toward MW beam power operation at the J-PARC neutrino beamline. By measuring the fluorescence light from proton-gas interactions, the BIF monitor will be used as a continuous and non-destructive diagnostic tool for monitoring the proton beam profile spill-by-spill, with position and width precision on the order of 200 µm. The main challenge lies in collecting a sufficient amount of fluorescence light for the beam profile reconstruction while controlling the beam-induced noise with the current beamline configuration. A study is presented with a particular focus on the optical system under development, which allows us to transport fluorescence light away from the high radiation environment near the proton beamline and detect the optical signal with a Multi-Pixel Photon-Counter-based fast readout.  
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