Author: Potylitsyn, A.
Paper Title Page
WEPB10 Grating Scanner for Measurement of Micron-size Beam Profiles 448
 
  • L.G. Sukhikh, A. Potylitsyn, S.A. Strokov
    TPU, Tomsk, Russia
  • G. Kube, K. Wittenburg
    DESY, Hamburg, Germany
 
  Funding: The work was partly supported by the program ‘‘Nauka' of the Russian Ministry of Education and Science, grant # 3.1903.2017
Wire scanners are widely used for transverse beam size diagnostics. The minimum detectable beam size is affected by the diameter of a single wire. The smallest carbon or tungsten wires used so far have diameters of about 4 microns. With the development of modern electron accelerators and the demands from future linear electron-positron colliders, sub-micron beam sizes have to be resolved. In order to increase the resolution, the decrease of the wire diameter is required. The authors of Ref. * proposed to manufacture thin gold stripes of rectangular shape (widths are equal to 1 µm or 2 µm and height is equal to 3 µm) on Si3N4 membrane. We propose to use another arrangement of gold stripes with varying period on a Si substrate. A set of 11 stripes with 1 µm width and 10 micron height with varying gap width in the range 3-0.25 µm ("grating scanner") was simulated by using an analytical model and by the Geant4 code. By moving this scanner across the beam one could measure the Bremsstrahlung yield vs. the coordinate, resulting in an oscillating dependence. The visibility of the resulting image allows defining the beam sizes in the range of 0.5-1.5 µm for the proposed scanner parameters.
* S. Borrelli et al., "Generation and Measurement of Sub-Micrometer Relativistic Electron Beams", arXiv:1804.04252v1 [physics.acc-ph] 11 Apr 2018
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEPB10  
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WEPB11 Spatial Resolution Improvement of OTR Monitors by Off-axis Light Collection 451
 
  • A. Potylitsyn, A.I. Novokshonov, L.G. Sukhikh
    TPU, Tomsk, Russia
  • G. Kube, A.I. Novokshonov
    DESY, Hamburg, Germany
 
  Funding: The work was partly supported by the program "Nauka" of the Russian Ministry of Education and Science, grant #3.1903.2017
The spatial resolution of an OTR monitor for electron beam profile diagnostics is determined by the resolution of the optical system and by the Point Spread Function (PSF) representing the single electron image. In the image plane, the PSF has a typical lobe-shape distribution with an inter-peak distance depending on wavelength and lens aperture ratio [*]. For a beam with a transverse rms size smaller than the distance, the reconstruction of the beam profile has several difficulties [**, ***]. We propose to reduce the PSF contribution and to improve the spatial resolution of an OTR monitor simply by rotating the lens optical axis with respect to the specular reflection direction. If the difference between the rotational angle and the lens aperture is much larger than the inverse Lorentz factor, the PSF has a Gaussian-like distribution which matches practically with the Airy distribution. Thus the resolution depends on wavelength and lens aperture. In principle, for lens apertures in the order of 0.1 rad such an approach should allow to measure beam sizes comparable to the wavelength of observation, using a simple deconvolution procedure for the measured image and the PSF.
* M. Castellano, V.Verzilov, Phys. Rev. ST-AB, 1 (1998).
** K.Kruchinin, S.T.Boogert, P.Karataev et al., Proc. IBIC 2013 (2013).
*** L.G. Sukhikh, A.P. Potylitsyn, G. Kube, Phys. Rev. AB 20 (2017).
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEPB11  
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WEPB14 Recent Results on Non-invasive Beam Size Measurement Methods Based on Polarization Currents 464
 
  • S. Mazzoni, M. Bergamaschi, O.R. Jones, R. Kieffer, T. Lefèvre, F. Roncarolo
    CERN, Geneva, Switzerland
  • A. Aryshev, N. Terunuma
    KEK, Ibaraki, Japan
  • L.Y. Bartnik, M.G. Billing, J.V. Conway, M.J. Forster, Y.L.P. Fuentes, J.P. Shanks, S. Wang
    Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
  • V.V. Bleko, A.S. Konkov, A. Potylitsyn
    TPU, Tomsk, Russia
  • L. Bobb
    DLS, Oxfordshire, United Kingdom
  • P. Karataev, K. Lekomtsev
    JAI, Egham, Surrey, United Kingdom
  • P. Karataev
    Royal Holloway, University of London, Surrey, United Kingdom
 
  We present recent results on non-invasive beam profile measurement techniques based on Diffraction Radiation (DR) and Cherenkov Diffraction Radiation (ChDR). Both methods exploit the analysis of broadband electromagnetic radiation resulting from polarization currents produced in, or at the boundary of, a medium in close proximity of a charged particle beam. To increase the resolution of DR, measurements were performed in the UV range at a wavelength of 250 nm. With such configurations, sensitivity to the beam size of a 1.2 GeV electron beam below 10 um was observed at the Accelerator Test Facility (ATF) at KEK, Japan. In the case of the ChDR, a proof of principle study was carried out at the Cornell Electron Storage Ring (CESR) where beam profiles were measured in 2017 on a 5.3 GeV positron beam. At the time of writing an experiment to measure the resolution limit of ChDR has been launched at ATF where smaller beam sizes are available. We will present experimental results and discuss the application of such techniques for future accelerators.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEPB14  
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