Author: Yabashi, M.
Paper Title Page
Temporal Diagnostics of Femtosecond Electron Bunches via X-ray Intensity Interferometry  
  • I. Inoue, T. Hara, Y. Inubushi, H. Tanaka, M. Yabashi
    RIKEN SPring-8 Center, Sayo-cho, Sayo-gun, Hyogo, Japan
  Optical pulses and particle beams with ultrashort temporal duration have been powerful probes for capturing ultrafast processes. An X-ray free-electron laser (XFEL) based on the self-amplified spontaneous emission scheme is a newly developed ultrafast light source with femtosecond duration. The ultrafast XFEL pulses are generated from the electron bunches (e-bunches) that are accelerated to a relativistic speed with strong compression to a femtosecond regime. Evaluation of the temporal profile of the e-bunch is therefore essential for optimizing accelerator parameters for achieving XFEL amplification, as well as for characterizing the XFEL pulse duration. As a new temporal diagnostic scheme for e-bunches, we recently propose an X-ray intensity interferometry using spontaneous X-ray beam generated by the e-bunch [1]. In this presentation, I will talk about the concept of the X-ray intensity interferometry for determination of ultrashort e-bunch duration. Also, I will report on the temporal diagnostics of 8.1-GeV e-bunch at SPring-8 Angstrom compact free-electron LAser (SACLA) using the X-ray intensity interferometry.
[1] I. Inoue, T. Hara, Y. Inubushi, K. Tono, T. Inagaki, T. Katayama, Y. Amemiya, H. Tanaka, and M. Yabashi, Phys. Rev. Acc. Beams, in press.
slides icon Slides THOA04 [6.281 MB]  
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