TPU
Tomsk, Russia
DOI Title
10.18429/JACoW-IBIC2018-WEPB10 Grating Scanner for Measurement of Micron-size Beam Profiles
10.18429/JACoW-IBIC2018-WEPB11 Spatial Resolution Improvement of OTR Monitors by Off-axis Light Collection
10.18429/JACoW-IBIC2018-WEPB14 Recent Results on Non-invasive Beam Size Measurement Methods Based on Polarization Currents