Keyword: beam-transport
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MOPC04 Beam Charge Measurement and System Calibration in CSNS proton, target, extraction, operation 122
  • W.L. Huang, F. Li
    CSNS, Guangdong Province, People's Republic of China
  • L. Ma, S. Wang, T.G. Xu
    IHEP, Beijing, People's Republic of China
  In China Spallation Neutron Source(CSNS), the beam charge monitors along the ring to the target beam transport line(RTBT) and the ring to the dump beam transport line(RDBT), are consisted of an ICT and three FCTs manufactured by Bergoz. The electronics includes a set of NI PXIe-5160 oscilloscope digitizer, and a Beam Charge Monitor(BCM) from Bergoz as supplementary. The beam charge monitors provide the following information: a) the quantity of protons bombarded the tungsten target; b) the efficiency of particle transportation; c) a T0 signal to the detectors and spectrometers of the white neutron source. With the calibration with an octopus 50Ω terminator in lab and an onboard 16-turn calibrating coils at the local control room, corrections for the introducing the 16-turn calibrating coils and the long cable were made. An accuracy of ±2% for the beam charge measurement during the machine operation has been achieved with the ICT/FCTs and a PXIe-5160 oscilloscope digitizer.  
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WEPB12 Design and Implementation of Non-Invasive Profile Monitors for the ESS LEBT instrumentation, HOM, ion-source, simulation 455
  • C.A. Thomas, T.J. Grandsaert, H. Kocevar, Ø. Midttun, N. Milas, R. Miyamoto, T.J. Shea
    ESS, Lund, Sweden
  Non-invasive Profile Monitors are designed and distributed along the ESS Linac. In the Low Energy Beam Transport (LEBT), a specific one has been designed to be primarily a beam position monitor. Its main requirement is to measure the beam position with 100µm accuracy, and in addition it provides the beam profile and size. This performance have been shown to be possible and remains to be demonstrated experimentally. The instrument is also potentially capable of measuring the angle of the beam and its divergence. In this paper we will study the accuracy of such a measurement as function of the instrument image quality.  
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