Keyword: ion-source
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WEPB12 Design and Implementation of Non-Invasive Profile Monitors for the ESS LEBT instrumentation, HOM, beam-transport, simulation 455
  • C.A. Thomas, T.J. Grandsaert, H. Kocevar, Ø. Midttun, N. Milas, R. Miyamoto, T.J. Shea
    ESS, Lund, Sweden
  Non-invasive Profile Monitors are designed and distributed along the ESS Linac. In the Low Energy Beam Transport (LEBT), a specific one has been designed to be primarily a beam position monitor. Its main requirement is to measure the beam position with 100µm accuracy, and in addition it provides the beam profile and size. This performance have been shown to be possible and remains to be demonstrated experimentally. The instrument is also potentially capable of measuring the angle of the beam and its divergence. In this paper we will study the accuracy of such a measurement as function of the instrument image quality.  
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