Keyword: optics
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MOOA02 Noise in Radio/Optical Communications electron, electronics, radio-frequency, laser 1
 
  • M. Vidmar
    University of Ljubljana, Faculty of Electrical Engineering, Ljubljana, Slovenia
 
  Noise is a random signal that affects the performance of all electronic and/or optical devices. Although the sources of different kinds of noise have their backgrounds in physics, engineers dealing with noise use different methods and units to specify noise. The intention of this tutorial is to describe the main effects of noise in electronics up to optical frequencies while providing links between the physics and engineering worlds. In particular, noise is considered harmful while degrading the signal-to-noise ratio or broadening the spectrum of signal sources. On the other hand, noise can be itself a useful signal. Finally, artificially generated signals that exhibit many properties of random natural noise are sometimes required.  
slides icon Slides MOOA02 [3.742 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-MOOA02  
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MOPA09 Overview of Beam Instrumentation and Commissioning Results from the Coherent Electron Cooling Experiment at BNL* electron, cathode, laser, undulator 43
 
  • T.A. Miller, J.C.B. Brutus, W.C. Dawson, D.M. Gassner, R.L. Hulsart, P. Inacker, J.P. Jamilkowski, D. Kayran, V. Litvinenko, C. Liu, R.J. Michnoff, M.G. Minty, P. Oddo, M.C. Paniccia, I. Pinayev, Z. Sorrell, J.E. Tuozzolo
    BNL, Upton, Long Island, New York, USA
  • V. Litvinenko
    Stony Brook University, Stony Brook, USA
 
  Funding: *Work supported by Brookhaven Science Associates, LLC under Contract No. DE-AC02-98CH10886 with the U.S. Department of Energy
The Coherent Electron Cooling (CeC) Proof-of-Principle experiment [1], installed in the RHIC tunnel at BNL, has completed its second run. In this experiment, an FEL is used to amplify patterns imprinted on the cooling electron beam by the RHIC ion bunches and then the imprinted pattern is fed back to the ions to achieve cooling of the ion beam. Diagnostics for the CeC experiment have been fully commissioned during this year's run. An overview of the beam instrumentation is presented, this includes devices for measurements of beam current, position, profile, bunch charge, emittance, as well as gun photocathode imaging and FEL infra-red light emission diagnostics. Design details are discussed and beam measurement results are presented.
[1] I. Pinayev, et al, 'First Results of Proof-of-Principle Experiment of Coherent Electron Cooling at BNL' proceedings from IPAC 2018, Vancouver, CANADA
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-MOPA09  
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TUOA02 Application of Machine Learning to Beam Diagnostics network, diagnostics, controls, simulation 169
 
  • E. Fol, J.M. Coello de Portugal, R. Tomás
    CERN, Geneva, Switzerland
 
  Machine learning techniques are used in various scientific and industry fields as a powerful tool for data analysis and automatization. The presentation is devoted to exploration of relevant machine learning methods for beam diagnostics. The target is to provide an insight into modern machine learning techniques, which can be applied to improve current beam diagnostics and general applications in accelerators. Possible concepts for future applications are also presented.  
slides icon Slides TUOA02 [2.497 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-TUOA02  
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TUOB02 Optics Measurements in Storage Rings: Simultaneous 3-Dimensional Beam Excitation and Novel Harmonic Analysis dipole, betatron, synchrotron, coupling 177
 
  • L. Malina, J.M. Coello de Portugal, J. Dilly, P.K. Skowroński, R. Tomás
    CERN, Geneva, Switzerland
 
  Optics measurements in storage rings employ turn-by-turn data of transversely excited beams. Chromatic parameters need measurements to be repeated at different beam energies, which is time-consuming. We present an optics measurement method based on adiabatic simultaneous 3-dimensional beam excitation, where no repetition at different energies is needed. In the LHC, the method has been successfully demonstrated utilising AC-dipoles combined with RF frequency modulation. It allows measuring the linear optics parameters and chromatic properties at the same time without resolution deterioration. We also present a new accurate harmonic analysis algorithm that exploits the noise cleaning based on singular value decomposition to compress the input data. In the LHC, this sped up harmonic analysis by a factor up to 300. These methods are becoming a "push the button" operational tool to measure the optics.  
slides icon Slides TUOB02 [1.117 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-TUOB02  
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WEOA03 First Electro-Optical Bunch Length Measurements from the European XFEL laser, electron, FEL, detector 338
 
  • B. Steffen, M.K. Czwalinna, C. Gerth, P. Peier
    DESY, Hamburg, Germany
 
  Three electro-optical bunch length detection systems based on spectral decoding have been installed and are being commissioned at the European XFEL. The systems are capable of recording individual longitudinal bunch profiles with sub-picosecond resolution at a bunch repetition rate 1.13 MHz. Bunch lengths and arrival times of entire bunch trains with single-bunch resolution have been measured as well as jitter and drifts for consecutive bunch trains. In this paper, we present first measurement results for the electro-optical detection system located after the second bunch compressor. A preliminary comparison with data from the bunch arrival-time monitor shows good agreement.  
slides icon Slides WEOA03 [4.496 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEOA03  
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WEOC02 Review of Recent Status of Coded Aperture X-ray Monitors for Beam Size Measurement detector, emittance, electron, MMI 361
 
  • J.W. Flanagan
    KEK, Ibaraki, Japan
 
  Funding: US-Japan Cooperation in High Energy Physics (Japan Monbukagakusho and US DOE). Kakenhi.
X-ray beam profile monitors based on coded aperture imaging use an array of pinholes or slits to achieve large open apertures, which provide improved photon collection efficiency over single pinholes or slits. The resulting improvement in photon statistics makes possible single-bunch, single-turn measurements at lower bunch currents than are possible with a single pinhole or slit. In addition, the coded aperture pattern provides extra information for beam profile reconstruction, which makes possible somewhat improved resolution, as compared to a single slit. The reconstruction algorithm for coded aperture imaging is more complicated and computing-intensive than that for a single slit, though with certain classes of coded pertures a faster reconstruction method is possible. This talk will provide a survey of efforts to use coded aperture imaging for beam profile diagnostics at accelerators to date, covering principles and practical experiences with the technique, as well as prospects for the future at SuperKEKB, where it forms the primary means of measuring vertical beam sizes.
 
slides icon Slides WEOC02 [4.065 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEOC02  
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WEPB21 Transverse Beam Emittance Measurements with Multi-Slit and Moving-Slit Devices for LEReC emittance, electron, cavity, solenoid 486
 
  • C. Liu, A.V. Fedotov, D.M. Gassner, X. Gu, D. Kayran, J. Kewisch, T.A. Miller, M.G. Minty, V. Ptitsyn, S. Seletskiy, A. Sukhanov, D. Weiss
    BNL, Upton, Long Island, New York, USA
  • A. Fuchs
    Ward Melville High School, Setauket- East Setauket, USA
 
  Funding: Work supported by Brookhaven Science Associates, LLC under Contract No. DE-AC02-98CH10886 with the U.S. Department of Energy.
Low Energy RHIC electron cooling (LEReC) [1] is the first bunched electron cooler, designed to cool low energy ion beams at RHIC. The beam quality, including the transverse beam emittance, is critical for the success of cooling. The transverse electron beam emittance was characterized with a multi-slit and moving-slit device at various locations in the beamline. The beam emittance measurement and analysis are presented in this report.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEPB21  
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WEPC05 The European XFEL Wire Scanner System detector, FEL, electron, undulator 498
 
  • T. Lensch, S. Liu, M. Scholz
    DESY, Hamburg, Germany
 
  The European-XFEL (E-XFEL) is an X-ray Free Electron Laser facility located in Hamburg (Germany). The superconducting accelerator for up to 17.5 GeV electrons will provide photons simultaneously to several user stations. Currently 12 Wire Scanner units are used to image transverse beam profiles in the high energy sections. These scanners provide a slow scan mode which is currently used to measure beam emittance and beam halo distributions. When operating with long bunch trains (>100 bunches) also fast scans are planned to measure beam sizes in an almost nondestructive manner. Scattered electrons can be detected with regular Beam Loss Monitors (BLM) as well as dedicated wire scanner detectors. Latter are installed in different variants at certain positions in the machine. Further developments are ongoing to optimize the sensitivity of the detectors to be able to measure both, beam halo and beam cores within the same measurement with the same detector. This paper describes the current status of the system and examples of different slow scan measurements.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IBIC2018-WEPC05  
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